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#FL-303 fix for some spi bugs, test app for sd-nfc interconnection (#247)

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* sd-nfc test app

* do not hold spi in disable mode

* disable pullups in nfc chip
This commit is contained in:
DrZlo13
2020-11-18 16:01:25 +03:00
committed by GitHub
parent 9bbc8fafe5
commit 27ae2a8fa9
5 changed files with 225 additions and 16 deletions
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7
lib/ST25RFAL002/source/st25r3916/rfal_rfst25r3916.c
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@@ -467,6 +467,13 @@ ReturnCode rfalInitialize( void )
/* Apply RF Chip generic initialization */
rfalSetAnalogConfig( (RFAL_ANALOG_CONFIG_TECH_CHIP | RFAL_ANALOG_CONFIG_CHIP_INIT) );
// TODO:
// I don't want to mess with config table ("Default Analog Configuration for Chip-Specific Reset", rfal_analogConfigTbl.h)
// so with every rfalSetAnalogConfig((RFAL_ANALOG_CONFIG_CHIP_INIT)) currently we need to clear pulldown bits
// luckily for us this is done only here
// disable pulldowns
st25r3916ClrRegisterBits(ST25R3916_REG_IO_CONF2, ( ST25R3916_REG_IO_CONF2_miso_pd1 | ST25R3916_REG_IO_CONF2_miso_pd2 ) );
/*******************************************************************************/
/* Enable External Field Detector as: Automatics */