[FL-2627] Flipper applications: SDK, build and debug system (#1387)

* Added support for running applications from SD card (FAPs - Flipper Application Packages)
* Added plugin_dist target for fbt to build FAPs
* All apps of type FlipperAppType.EXTERNAL and FlipperAppType.PLUGIN are built as FAPs by default
* Updated VSCode configuration for new fbt features - re-deploy stock configuration to use them
* Added debugging support for FAPs with fbt debug & VSCode
* Added public firmware API with automated versioning

Co-authored-by: hedger <hedger@users.noreply.github.com>
Co-authored-by: SG <who.just.the.doctor@gmail.com>
Co-authored-by: あく <alleteam@gmail.com>

applications/debug/bt_debug_app/views/bt_test.h

@@ -0,0 +1,46 @@
+#pragma once
+#include <gui/view.h>
+
+typedef enum {
+    BtTestStateStarted,
+    BtTestStateStopped,
+} BtTestState;
+
+typedef struct BtTest BtTest;
+typedef void (*BtTestChangeStateCallback)(BtTestState state, void* context);
+typedef void (*BtTestBackCallback)(void* context);
+typedef struct BtTestParam BtTestParam;
+typedef void (*BtTestParamChangeCallback)(BtTestParam* param);
+
+BtTest* bt_test_alloc();
+
+void bt_test_free(BtTest* bt_test);
+
+View* bt_test_get_view(BtTest* bt_test);
+
+BtTestParam* bt_test_param_add(
+    BtTest* bt_test,
+    const char* label,
+    uint8_t values_count,
+    BtTestParamChangeCallback change_callback,
+    void* context);
+
+void bt_test_set_change_state_callback(BtTest* bt_test, BtTestChangeStateCallback callback);
+
+void bt_test_set_back_callback(BtTest* bt_test, BtTestBackCallback callback);
+
+void bt_test_set_context(BtTest* bt_test, void* context);
+
+void bt_test_set_rssi(BtTest* bt_test, float rssi);
+
+void bt_test_set_packets_tx(BtTest* bt_test, uint32_t packets_num);
+
+void bt_test_set_packets_rx(BtTest* bt_test, uint32_t packets_num);
+
+void bt_test_set_current_value_index(BtTestParam* param, uint8_t current_value_index);
+
+void bt_test_set_current_value_text(BtTestParam* param, const char* current_value_text);
+
+uint8_t bt_test_get_current_value_index(BtTestParam* param);
+
+void* bt_test_get_context(BtTestParam* param);