9bfb641d3e
* Makefile: unit tests pack * RFID: pulse joiner and its unit test * Move pulse protocol helpers to appropriate place * Drop pulse_joiner tests * Generic protocol, protocols dictionary, unit test * Protocol dict unit test * iButton: protocols dictionary * Lib: varint * Lib: profiler * Unit test: varint * rfid: worker mockup * LFRFID: em4100 unit test * Storage: file_exist function * rfid: fsk osc * rfid: generic fsk demodulator * rfid: protocol em4100 * rfid: protocol h10301 * rfid: protocol io prox xsf * Unit test: rfid protocols * rfid: new hal * rfid: raw worker * Unit test: fix error output * rfid: worker * rfid: plain c cli * fw: migrate to scons * lfrfid: full io prox support * unit test: io prox protocol * SubGHZ: move bit defines to source * FSK oscillator: level duration compability * libs: bit manipulation library * lfrfid: ioprox protocol, use bit library and new level duration method of FSK ocillator * bit lib: unit tests * Bit lib: parity tests, remove every nth bit, copy bits * Lfrfid: awid protocol * bit lib: uint16 and uint32 getters, unit tests * lfrfid: FDX-B read, draft version * Minunit: better memeq assert * bit lib: reverse, print, print regions * Protocol dict: get protocol features, get protocol validate count * lfrfid worker: improved read * lfrfid raw worker: psk support * Cli: rfid plain C cli * protocol AWID: render * protocol em4100: render * protocol h10301: render * protocol indala26: support every indala 26 scramble * Protocol IO Prox: render * Protocol FDX-B: advanced read * lfrfid: remove unused test function * lfrfid: fix os primitives * bit lib: crc16 and unit tests * FDX-B: save data * lfrfid worker: increase stream size. Alloc raw worker only when needed. * lfrfid: indala26 emulation * lfrfid: prepare to write * lfrfid: fdx-b emulation * lfrfid: awid, ioprox write * lfrfid: write t55xx w\o validation * lfrfid: better t55xx block0 handling * lfrfid: use new t5577 functions in worker * lfrfid: improve protocol description * lfrfid: write and verify * lfrfid: delete cpp cli * lfrfid: improve worker usage * lfrfid-app: step to new worker * lfrfid: old indala (I40134) load fallback * lfrfid: indala26, recover wrong synced data * lfrfid: remove old worker * lfrfid app: dummy read screen * lfrfid app: less dummy read screen * lfrfid: generic 96-bit HID protocol (covers up to HID 37-bit) * rename * lfrfid: improve indala26 read * lfrfid: generic 192-bit HID protocol (covers all HID extended) * lfrfid: TODO about HID render * lfrfid: new protocol FDX-A * lfrfid-app: correct worker stop on exit * misc fixes * lfrfid: FDX-A and HID distinguishability has been fixed. * lfrfid: decode HID size header and render it (#1612) * lfrfid: rename HID96 and HID192 to HIDProx and HIDExt * lfrfid: extra actions scene * lfrfid: decode generic HID Proximity size lazily (#1618) * lib: stream of data buffers concept * lfrfid: raw file helper * lfrfid: changed raw worker api * lfrfid: packed varint pair * lfrfid: read stream speedup * lfrfid app: show read mode * Documentation * lfrfid app: raw read gui * lfrfid app: storage check for raw read * memleak fix * review fixes * lfrfid app: read blink color * lfrfid app: reset key name after read * review fixes * lfrfid app: fix copypasted text * review fixes * lfrfid: disable debug gpio * lfrfid: card detection events * lfrfid: change validation color from magenta to green * Update core_defines. * lfrfid: prefix fdx-b id by zeroes * lfrfid: parse up to 43-bit HID Proximity keys (#1640) * Fbt: downgrade toolchain and fix PS1 * lfrfid: fix unit tests * lfrfid app: remove printf * lfrfid: indala26, use bit 55 as data * lfrfid: indala26, better brief format * lfrfid: indala26, loading fallback * lfrfid: read timing tuning Co-authored-by: James Ide <ide@users.noreply.github.com> Co-authored-by: あく <alleteam@gmail.com>
88 lines
2.8 KiB
C
88 lines
2.8 KiB
C
#include <furi.h>
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#include <furi_hal.h>
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#include "../minunit.h"
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#include <toolbox/varint.h>
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#include <toolbox/profiler.h>
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MU_TEST(test_varint_basic_u) {
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mu_assert_int_eq(1, varint_uint32_length(0));
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mu_assert_int_eq(5, varint_uint32_length(UINT32_MAX));
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uint8_t data[8] = {};
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uint32_t out_value;
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mu_assert_int_eq(1, varint_uint32_pack(0, data));
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mu_assert_int_eq(1, varint_uint32_unpack(&out_value, data, 8));
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mu_assert_int_eq(0, out_value);
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mu_assert_int_eq(5, varint_uint32_pack(UINT32_MAX, data));
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mu_assert_int_eq(5, varint_uint32_unpack(&out_value, data, 8));
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mu_assert_int_eq(UINT32_MAX, out_value);
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}
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MU_TEST(test_varint_basic_i) {
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mu_assert_int_eq(5, varint_int32_length(INT32_MIN / 2));
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mu_assert_int_eq(1, varint_int32_length(0));
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mu_assert_int_eq(5, varint_int32_length(INT32_MAX / 2));
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mu_assert_int_eq(2, varint_int32_length(127));
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mu_assert_int_eq(2, varint_int32_length(-127));
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uint8_t data[8] = {};
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int32_t out_value;
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mu_assert_int_eq(1, varint_int32_pack(0, data));
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mu_assert_int_eq(1, varint_int32_unpack(&out_value, data, 8));
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mu_assert_int_eq(0, out_value);
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mu_assert_int_eq(2, varint_int32_pack(127, data));
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mu_assert_int_eq(2, varint_int32_unpack(&out_value, data, 8));
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mu_assert_int_eq(127, out_value);
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mu_assert_int_eq(2, varint_int32_pack(-127, data));
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mu_assert_int_eq(2, varint_int32_unpack(&out_value, data, 8));
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mu_assert_int_eq(-127, out_value);
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mu_assert_int_eq(5, varint_int32_pack(INT32_MAX, data));
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mu_assert_int_eq(5, varint_int32_unpack(&out_value, data, 8));
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mu_assert_int_eq(INT32_MAX, out_value);
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mu_assert_int_eq(5, varint_int32_pack(INT32_MIN / 2 + 1, data));
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mu_assert_int_eq(5, varint_int32_unpack(&out_value, data, 8));
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mu_assert_int_eq(INT32_MIN / 2 + 1, out_value);
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}
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MU_TEST(test_varint_rand_u) {
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uint8_t data[8] = {};
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uint32_t out_value;
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for(size_t i = 0; i < 200000; i++) {
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uint32_t rand_value = rand();
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mu_assert_int_eq(
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varint_uint32_pack(rand_value, data), varint_uint32_unpack(&out_value, data, 8));
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mu_assert_int_eq(rand_value, out_value);
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}
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}
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MU_TEST(test_varint_rand_i) {
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uint8_t data[8] = {};
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int32_t out_value;
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for(size_t i = 0; i < 200000; i++) {
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int32_t rand_value = rand() + (INT32_MIN / 2 + 1);
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mu_assert_int_eq(
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varint_int32_pack(rand_value, data), varint_int32_unpack(&out_value, data, 8));
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mu_assert_int_eq(rand_value, out_value);
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}
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}
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MU_TEST_SUITE(test_varint_suite) {
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MU_RUN_TEST(test_varint_basic_u);
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MU_RUN_TEST(test_varint_basic_i);
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MU_RUN_TEST(test_varint_rand_u);
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MU_RUN_TEST(test_varint_rand_i);
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}
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int run_minunit_test_varint() {
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MU_RUN_SUITE(test_varint_suite);
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return MU_EXIT_CODE;
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} |