FuriHal: add i2c unit tests (#2089)
* FuriHal: add i2c unit tests * FuriHal: restructure unit tests Co-authored-by: Sergey Gavrilov <who.just.the.doctor@gmail.com>
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116
applications/debug/unit_tests/furi_hal/furi_hal_tests.c
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116
applications/debug/unit_tests/furi_hal/furi_hal_tests.c
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@ -0,0 +1,116 @@
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#include <stdio.h>
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#include <furi.h>
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#include <furi_hal.h>
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#include <lp5562_reg.h>
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#include "../minunit.h"
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#define DATA_SIZE 4
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static void furi_hal_i2c_int_setup() {
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furi_hal_i2c_acquire(&furi_hal_i2c_handle_power);
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}
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static void furi_hal_i2c_int_teardown() {
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furi_hal_i2c_release(&furi_hal_i2c_handle_power);
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}
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MU_TEST(furi_hal_i2c_int_1b) {
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bool ret = false;
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uint8_t data_one = 0;
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// 1 byte: read, write, read
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ret = furi_hal_i2c_read_reg_8(
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&furi_hal_i2c_handle_power,
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LP5562_ADDRESS,
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LP5562_CHANNEL_BLUE_CURRENT_REGISTER,
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&data_one,
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LP5562_I2C_TIMEOUT);
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mu_assert(ret, "0 read_reg_8 failed");
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mu_assert(data_one != 0, "0 invalid data");
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ret = furi_hal_i2c_write_reg_8(
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&furi_hal_i2c_handle_power,
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LP5562_ADDRESS,
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LP5562_CHANNEL_BLUE_CURRENT_REGISTER,
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data_one,
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LP5562_I2C_TIMEOUT);
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mu_assert(ret, "1 write_reg_8 failed");
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ret = furi_hal_i2c_read_reg_8(
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&furi_hal_i2c_handle_power,
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LP5562_ADDRESS,
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LP5562_CHANNEL_BLUE_CURRENT_REGISTER,
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&data_one,
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LP5562_I2C_TIMEOUT);
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mu_assert(ret, "2 read_reg_8 failed");
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mu_assert(data_one != 0, "2 invalid data");
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}
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MU_TEST(furi_hal_i2c_int_3b) {
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bool ret = false;
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uint8_t data_many[DATA_SIZE] = {0};
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// 3 byte: read, write, read
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data_many[0] = LP5562_CHANNEL_BLUE_CURRENT_REGISTER;
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ret = furi_hal_i2c_tx(
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&furi_hal_i2c_handle_power, LP5562_ADDRESS, data_many, 1, LP5562_I2C_TIMEOUT);
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mu_assert(ret, "3 tx failed");
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ret = furi_hal_i2c_rx(
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&furi_hal_i2c_handle_power,
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LP5562_ADDRESS,
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data_many + 1,
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DATA_SIZE - 1,
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LP5562_I2C_TIMEOUT);
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mu_assert(ret, "4 rx failed");
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for(size_t i = 0; i < DATA_SIZE; i++) mu_assert(data_many[i] != 0, "4 invalid data_many");
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ret = furi_hal_i2c_tx(
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&furi_hal_i2c_handle_power, LP5562_ADDRESS, data_many, DATA_SIZE, LP5562_I2C_TIMEOUT);
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mu_assert(ret, "5 tx failed");
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ret = furi_hal_i2c_tx(
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&furi_hal_i2c_handle_power, LP5562_ADDRESS, data_many, 1, LP5562_I2C_TIMEOUT);
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mu_assert(ret, "6 tx failed");
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ret = furi_hal_i2c_rx(
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&furi_hal_i2c_handle_power,
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LP5562_ADDRESS,
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data_many + 1,
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DATA_SIZE - 1,
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LP5562_I2C_TIMEOUT);
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mu_assert(ret, "7 rx failed");
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for(size_t i = 0; i < DATA_SIZE; i++) mu_assert(data_many[i] != 0, "7 invalid data_many");
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}
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MU_TEST(furi_hal_i2c_int_1b_fail) {
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bool ret = false;
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uint8_t data_one = 0;
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// 1 byte: fail, read, fail, write, fail, read
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data_one = 0;
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ret = furi_hal_i2c_read_reg_8(
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&furi_hal_i2c_handle_power,
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LP5562_ADDRESS + 0x10,
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LP5562_CHANNEL_BLUE_CURRENT_REGISTER,
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&data_one,
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LP5562_I2C_TIMEOUT);
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mu_assert(!ret, "8 read_reg_8 failed");
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mu_assert(data_one == 0, "8 invalid data");
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ret = furi_hal_i2c_read_reg_8(
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&furi_hal_i2c_handle_power,
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LP5562_ADDRESS,
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LP5562_CHANNEL_BLUE_CURRENT_REGISTER,
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&data_one,
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LP5562_I2C_TIMEOUT);
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mu_assert(ret, "9 read_reg_8 failed");
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mu_assert(data_one != 0, "9 invalid data");
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}
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MU_TEST_SUITE(furi_hal_i2c_int_suite) {
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MU_SUITE_CONFIGURE(&furi_hal_i2c_int_setup, &furi_hal_i2c_int_teardown);
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MU_RUN_TEST(furi_hal_i2c_int_1b);
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MU_RUN_TEST(furi_hal_i2c_int_3b);
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MU_RUN_TEST(furi_hal_i2c_int_1b_fail);
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}
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int run_minunit_test_furi_hal() {
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MU_RUN_SUITE(furi_hal_i2c_int_suite);
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return MU_EXIT_CODE;
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}
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@ -9,6 +9,7 @@
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#define TAG "UnitTests"
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int run_minunit_test_furi();
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int run_minunit_test_furi_hal();
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int run_minunit_test_furi_string();
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int run_minunit_test_infrared();
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int run_minunit_test_rpc();
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@ -32,6 +33,7 @@ typedef struct {
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const UnitTest unit_tests[] = {
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{.name = "furi", .entry = run_minunit_test_furi},
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{.name = "furi_hal", .entry = run_minunit_test_furi_hal},
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{.name = "furi_string", .entry = run_minunit_test_furi_string},
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{.name = "storage", .entry = run_minunit_test_storage},
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{.name = "stream", .entry = run_minunit_test_stream},
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